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Applications of digital image processing VI : August 23-26, 1983, San Diego, California

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索取号:TN27-53/E804/6
作者:
出版社:California Bellingham, Wash., USA : SPIE-the International Society for Optical Engineering, 1983.

Mass media and society

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索取号:C91/E20011.3
作者:
出版社:London : Arnold, 2000.

Emerging optical materials : [proceedings] : August 25-26, 1981, San Diego, California

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索取号:TN24-53/E901
作者:
出版社:Bellingham, Wash. : SPIE--The International Society for Optical Engineering, 1982.

Picosecond lasers and applications : January 26-27, 1982, Los Angeles, California

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索取号:TN24-53/E905
作者:
出版社:Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 1982.

Optical thin films : [symposium] January 26-27, 1982, Los Angeles, California

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索取号:TN24-53/E904
作者:
出版社:Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 1982.

Sensor design using computer tools : [proceedings] : January 28-29, 1982, Los Angeles, California

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索取号:TN24-53/E903
作者:
出版社:Bellingham, Wash. : SPIE--The International Society for Optical Engineering, 1982.

Ethnic conflicts and civil society : proposals for a new erain Eastern Europe

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索取号:D751.06/E991
作者:
出版社:Aldershot, Hants, England ; Brookfield, Vt., USA : Ashgate, c1997.

Image processing : February 24-26, 1976, Asilomar Conference Center, Pacific Grove, California

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索取号:TN27-53/E803
作者:Spie Seminar on Image Processing、 Asilomar Conference Center、 1976.、Urbach、 John C.、Optical Society of America.、Society of Photo-Optical Instrumentation Engineers.、
出版社:[Palos Verdes Estates, Calif.] : SPIE, 1976.

Proceedings of the Workshop on Picture Data Description and Management, August 27-28, 1980, Asilomar, Calif

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索取号:TN27-53/E904/1980
作者:Workshop on Picture Data Description and Management (1980 : Asilomar、 Calif.)、IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis.、
出版社:New York IEEE Los Alamitos, CA : The Society, c1980.

Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices

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索取号:TN3-53/E802/1978
作者:Topical Conference on Characterization Techniques for Semiconductor Materials and Devices (1978 : Seattle、 Wash.)、Barnes、 Peter A.、Rozgonyi、 George A.、Electrochemical Society. Electronics Division.、
出版社:Princeton, N.J. : Electrochemical Society, 1978.

Business, government, and society: a managerial perspective : text and cases

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索取号:F471.2/E903.8
作者:Steiner、 George Albert、 1912-、Steiner、 John F.、
出版社:New York : McGraw-Hill, 1996.

14th Symposium on Logic in Computer Science : proceedings : July 2-5, 1999, Trento, Italy

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索取号:TP301-53/E991/14
作者:Symposium on Logic in Computer Science (14th : 1999 : Trento、 Italy)、IEEE Computer Society. Technical Committee on Mathematical Foundations of Computing.、
出版社:Los Alamitos, Calif : IEEE Computer Society Press, c1999.

Digest : 1979 IEEE MTT-S International Microwave Symposium

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索取号:TN019.2-7/E801/1979
作者:IEEE MTT-S International Microwave Symposium (1979 : Orlando、 Fla.)、Tracy、 John E、Institute of Electrical and Electronics Engineers、IEEE Microwave Theory and Techniques Society、
出版社:New York : Institute of Electrical and Electronics Engineers, c1979

Electron microscopy 1982 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978

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索取号:TN153-53/E801/10.3
作者:International Congress on Electron Microscopy (10th : 19882 : West Germany、 Hamburg.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、
出版社:West German Toronto : Hamburg Microscopical Society of Canada, 1982,c1978.

Digital image processing : January 22-23, 1985, Los Angeles, California

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索取号:TN24-53/E907
作者:
出版社:Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, 1985.

Applications of digital image processing VII : August 21-24, 1984, San Diego, California

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索取号:TN27-53/E804/7
作者:
出版社:Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, 1984.
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